Lab Characterization and Validation

Industry leaders are using a new approach to semiconductor test to meet the latest RF and mixed-signal IC test challenges. With NI’s open, software-defined platform, customers can meet evolving test requirements and manage schedule pressures.

A Smarter Approach to Characterization Test

When ICs were simpler and less integrated, fixed-functionality box instruments were sufficient in the lab. But as test requirements grow with increased integration, so does the need for a broader mix of instrumentation. It is common to find a characterization bench that is overflowing with instrumentation. But space isn’t the only problem. Box instruments are optimized to work independently instead of together; integration over GPIB or Ethernet is not optimal for high data throughput, low latency communication, and tight synchronization. NI’s approach to semiconductor characterization and validation is based on a single underlying platform of PXI and software that you can use from the lab through production. Using this approach, you can improve time to market with the ability to characterize components more quickly while reducing capital equipment costs and improving the efficiency of your team.

NI Semiconductor Brochure

Learn more about how you can lower your test costs for IC characterization and design validation with a platform-based approach.

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Products and Solutions

NI Partner Network

The NI Partner Network is a global community of domain, application, and overall test development experts working closely with NI to meet the needs of the engineering community. NI Partners are trusted solution providers, systems integrators, consultants, product developers, and services and sales channel experts skilled across a wide range of industries and application areas.


PXI Platform Resource Kit

Learn the basics of the PXI platform for semiconductor characterization with architectural notes, relevant case studies, and performance metrics.